dynamic current造句
例句與造句
- Class dynamic current : 80ka
最大等級動穩(wěn)定電流： 80ka - Rated dynamic current
額定動態(tài)電流 - Ated dynamic current
額定動態(tài)電流 - Dynamic current monitor reflects transient loading current instantly to judge the faulty parts of mobile circuit board easily
動態(tài)電流監(jiān)測器能瞬時反映出負(fù)載跳變狀態(tài),更容易判斷手機(jī)板的故障部份。 - Spice experiments were done to simulate the dynamic currents of both the fault circuits and fault free circuits under the function of testing pairs
對于這些測試向量對，通過spice軟件模擬了故障電路和無故障電路在測試向量對作用下的動態(tài)電流。 - It's difficult to find dynamic current in a sentence. 用dynamic current造句挺難的
- If you need a programmable dynamic current source , find out about operational transconductance amps . most of the problem is figuring out when you need a programmable dynamic current source
如果需要一個可編程的動態(tài)電流源，找出運算跨導(dǎo)的放大器，大部分的問題就明白了。 - In this way , a simple and direct relation was build up between logical transitions and dynamic current , which makes possible iddt testing pattern generation on logical level
該方法在電路邏輯跳變與電路動態(tài)電流之間建立了一種簡單直觀的關(guān)系，使得動態(tài)電流測試產(chǎn)生能夠在邏輯級上得以實現(xiàn)。 - Therefore , as an enhancement of traditional methods of testing , the dynamic current ( iddt ) testing is being paid close attention to and studied by the research field and the industrial field progressively
因而這種方法作為傳統(tǒng)測試方法的一個補(bǔ)充,正逐步受到研究領(lǐng)域和工業(yè)領(lǐng)域的關(guān)注和研究。 - The simulation results showed that there are some differences between the waveforms of currents . by comparing the average dynamic currents , these test pairs can detect some faults
模擬結(jié)果表明，故障電路和無故障電路的動態(tài)電流產(chǎn)生了一定的差別，通過比較兩者的平均動態(tài)電流，這些測試向量對能有效的檢測某些故障。 - The dissertation studied the topology of system configuration , performed the modeling and matlab / pspice based simulation . the focus was put on the problems and their solutions that may be related to the static and dynamic current sharing of parallel connected dc power modules
進(jìn)行了系統(tǒng)結(jié)構(gòu)的設(shè)計，并聯(lián)系統(tǒng)的建模，以及運用matlab 、 pspice軟件的仿真，關(guān)注的中心是對并聯(lián)直流電源的靜態(tài)與動態(tài)均流等可能出現(xiàn)的問題進(jìn)行分析并找出解決方案。 - For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
為了便于測試,我們將生產(chǎn)過程中集成電路出現(xiàn)的多種多樣的缺陷抽象為各種模型。目前常用的故障模型主要有:固定故障,開路故障,橋接故障,存儲故障,時滯故障等。電壓測試主要針對固定型故障模型,多年的研究也取得了令人滿意的結(jié)果; cmos電路中的橋接故障則宜用穩(wěn)態(tài)電流測試方法( iddq )測試;對于電壓和穩(wěn)態(tài)電流難以測試的開路故障,可以使用瞬態(tài)電流測試( iddt )的方法進(jìn)行測試。 - At present testing method based on current testing has become an important cmos digital integrated circuit testing method which has been accepted widely . in order to improve the fault coverage of the testing to meet the demands of people , the dynamic current ( iddt ) testing was proposed to detect some faults that cannot be detected by other testing methods in the middle 1990 ’ s
90年代中期,人們提出了瞬態(tài)電流測試方法( iddt ) ,以便發(fā)現(xiàn)一些其他測試方法所不能發(fā)現(xiàn)的故障,進(jìn)一步從總體上提高測試的故障覆蓋率,滿足人們對高性能集成電路的需要。